| Section I : Future
Trends |
|
| Part I :
Reliability Engineering for the Future
,10-pages. |
Gerard
Collas (France) |
| Part II : New
Trends in System Reliability Evaluation
, 18-pages. |
Krishna B.
Misra (India) |
|
|
| Section II :
Towards Improved Techniques |
|
|
|
| Multiple
Variable Inversion Techniques ,
35-pages |
Malathi
Veeraraghavan and Kishore Trivedi ( U.S.A.) |
| Part I :
Decomposition and Reduction Techniques
, 29-pages. |
Frank
Beichelt ( Germany) |
| Part II :
Probabilistic Graph-Reduction Techniques
, 36-pages. |
Andrew M.
Shooman (U.S.A.) |
| Parallel
Algorithms and Implementations ,
18-pages. |
Narsingh Deo
and Muralidhar Medidi (U.S.A.) |
|
|
| Section III :
Towards Improved Analysis |
|
|
|
| Reliability of
k-out-of n Systems , 36-pages. |
Ali M.
Rushdi (Saudi Arabia) |
| Consecutive
k-out-of-n Systems , 15-pages. |
S.G.
Papastavridis and Markos V. Koutras (Greece) |
| Fault Tree
Analysis , 62- pages. |
Hiromitsu
Kumamoto (Japan) |
|
|
| Section IV :
Towards Better Tools |
|
|
|
| Digraph and
Causal Trees , 24-pages |
Takhisa
Kohda and Koichi Inoue (Japan) |
| Use of Petri
Nets for System Reliability Evaluation
, 25-pages. |
Gurdeep S.
Hura (Singapore) |
|
|
| Section V :
Towards Better Models |
|
|
|
| Human
Reliability Modeling , 40-pages. |
Joseph
Sharit (U.S.A.) |
| Common Cause
and Dependent Failure Modeling ,
30-pages. |
Per Hokstad
(Norway) |
| Software
Reliability Modeling , 33-pages. |
Tom Downs
(Australia) |
| Mechanical
System Reliability Evaluation ,
23-pages. |
S.S. Rao
(U.S.A.) |
|
|
| Section VI :
Towards Alternative Approaches |
|
|
|
| Use of Fuzzy
Sets Theory (Part I : Theory),
45-pages. |
Krishna B.
Misra (India) |
| Use of Fuzzy
Sets Theory (Part II : Applications),
33-pages. |
Takehisa
Onisawa (Japan) and Krishana B. Misra (India) |
| Dempster-Shafer
Theory and its Applications,
37-pages. |
Toshiyuki
Inagaki (Japan) |
|
|
| Section VII :
Towards Development of Non-Specialist’s Aid |
|
|
|
| Expert System
in Reliability Evaluation,
27-pages. |
D.J.
Russomanno, R.D. Bonnel and J.B. Bowles, (U.S.A.) |
| Reliability
Analyzer, 48-pages |
Krishna B.
Misra (India) |
